THE COMPUTER-CONTROLLED FIELD ION MICROSCOPE WITH ATOM-PROBE AT THE HAHN-MEITNER-INSTITUTE

Analysis at the Atomic Level: The Atom Probe Field-Ion Microscope

Figure 2. Angular distributions of inelastic scattering around the undiffracted beam and around a beam diffracted through an angle a. The shaded area represents the contribution from the diffracted beam to the intensity collected by an on-axis aperture of semi-angle A3. [6] Egerton, R. F., Electron Energy Loss Spectroscopy in the Electron Microscope, Plenum Press, New York (1986). [7] Steele, J...

A Time-of-flight Atom-probe Field-ion Microscope for the Study of Defects in Metals

An ultra-high vacuum time-of-flight (TOF) atom-probe field-ion microscope (FIM) specifically designed for the study of defects in metals is described. Performance experiments show that this instrument can clearly resolve the seven stable isotopes of molybdenum, the five stable isotopes of tungsten, and the two stable isotopes of rhenium in a tungsten-25at.% rhenium alloy. The entire process of ...

Nanoscale Microstructural Analyses by Atom Probe Field Ion Microscopy

Recent progress in atom probe field ion microscopy (APFIM) and its applications to nanoscale microstructural studies of metallic materials are reviewed. By employing a three dimensional atom probe (3DAP), it is possible to map out elemental distributions in the real space with almost an atomic resolution, and chemical analysis of interfaces and nanoparticles can be made with improved accuracy i...

Hahn-meitner-institut Berlin Annual Report 2001 Selected Results -sf

Scanning transmission ion microscope with a field ion source.

Experiments with a low-resolution scanning transmission ion microscope, using hydrogen ions from a field ionization source, indicate that it will be feasible by this approach to aim at high-resolution ion microscopy. Micrographs of unstained biological specimens have been obtained by critical range absorption of a 55 keV hydrogen ion beam at a resolution of 2000 A.